silicon wafers造句

例句与造句

1. The processing characteristics and some material properties of silicon wafers depend on the orientation .
   硅片的工艺性质与某些材料特性均与晶向有关。
2. The final ic is made by sequentially transferring the features from each mask, level by level, to the surface of the silicon wafer .
   按照顺序从每一块掩膜版上将图形一层一层地转移到硅片的表面，就制得了成品集成电路。
3. Lithography, as used in the manufacture of ics, is the process of transferring geometic shapes on a mask to the surface of a silicon wafer .
   光刻技术应用到集成电路制造中，就是将掩模版的几何图形转移到硅片表面的工艺过程。
4. Visual inspection for silicon wafers with specular surfaces
   镜面硅片的目视检查
5. Visual inspection for sliced and lapped silicon wafers
   切制硅片及磨光硅片的目视检查
6. It's difficult to find silicon wafers in a sentence. 用silicon wafers造句挺难的
7. Hot plate with silicon wafer lowered to heating position
   加热板与矽晶圆降低至加热位置。
8. Afm investigations of process of cu thin films deposited on silicon wafers
   基上沉积成核的演化过程
9. Mechanical test wafer - a silicon wafer used for testing purposes
   机械测试晶圆片-用于测试的晶圆片。
10. On the other hand , is a silicon wafer that a core resides on
    而芯片（ chip ）是将核心封装起来的一块硅片。
11. Hot plate with silicon wafer in initial configuration ( before heating )
    加热板与矽晶圆在启始状态（加热前） 。
12. Self - assembly of silica photonic crystals inside micro - channel on silicon wafer
    硅槽内自组装二氧化硅光子晶体
13. Contamination particulate - particles found on the surface of a silicon wafer
    沾污颗粒-晶圆片表面上的颗粒。
14. Contamination particulate - particles found on the surface of a silicon wafer
    沾污颗粒-晶的上面表片圆颗粒。
15. Test method for detection of oxidation induced defects in polished silicon wafers
    硅抛光片氧化诱生缺陷的检验方法
16. Effect of substrate orientation on microstructure of hydrogen - implanted silicon wafers
    面向对注氢硅片中微结构的影响
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